| Title | XPS studies for an iron-zirconium interface in an oxidizing environment |
| Publication Type | Journal Article |
| Year of Publication | 1995 |
| Authors | Li, YS, Liu, W, Wong, PC, Mitchell, KAR |
| Journal | Surface Review and Letters |
| Volume | 2 |
| Pagination | 759-763 |
| Date Published | Dec |
| Type of Article | Article |
| ISBN Number | 0218-625X |
| Keywords | DIFFUSION, THIN-FILMS, WT-PERCENT NB |
| Abstract | A bimetallic film of iron and zirconium (thicknesses about 17 and 52 Angstrom respectively) was deposited on a gold substrate and studied by XPS after exposing to O-2 (approximately 10(3) L) at room temperature, and then heating at progressively higher temperatures up to 400 degrees C. An iron-oxide/iron/zirconium-oxide sandwich structure is present after the room-temperature exposure to O-2, and this work shows the ready transfer of O from the iron side to the zirconium side of the Fe/Zr interface. Fe migration also occurs at 220 degrees C and above, while by 300 degrees C this diffusion appears to cause a substantial restructuring of the ZrO2 layer. |
| URL | <Go to ISI>://A1995TP61400007 |
