| Title | Threshold excitation and ionization of xenon by electron impact |
| Publication Type | Journal Article |
| Year of Publication | 1969 |
| Authors | Brion, CE, Eaton, CR, Olsen, LAR, Thomas, GE |
| Journal | CHEMICAL PHYSICS LETTERS |
| Volume | 3 |
| Pagination | 600-602 |
| Date Published | AUG |
| ISSN | 0009-2614 |
| Abstract | The threshold electron impact spectrum of xenon has been obtained using a velocity selected electron beam. Fine structure both above and below the first ionization potential is observed. Sulphur hexafluoride scavenging is used as the detection method. |
| DOI | 10.1016/0009-2614(69)85120-1 |
