| Title | Resistivity-microstructure correlation of self-annealed electrodeposited copper thin films |
| Publication Type | Journal Article |
| Year of Publication | 2012 |
| Authors | Alshwawreh, N, Militzer, M, Bizzotto, D, Kuo, JC |
| Journal | Microelectronic Engineering |
| Volume | 95 |
| Pagination | 26–33 |
| Date Published | jul |
