Research & Teaching Faculty

Default Header Image

Nano-level position resolution for particle tracking in digital in-line holographic microscopy

TitleNano-level position resolution for particle tracking in digital in-line holographic microscopy
Publication TypeJournal Article
Year of Publication2015
AuthorsLei, H, Hu, X, Zhu, P, Chang, X, Zeng, Y, Hu, C, Li, H, Hu, X
JournalJournal of Microscopy
Volume260
Start Page100
Pagination106