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Characterization of a Co–Se thin film by scanning Auger microscopy and Raman spectroscopy

TitleCharacterization of a Co–Se thin film by scanning Auger microscopy and Raman spectroscopy
Publication TypeJournal Article
Year of Publication2006
AuthorsTeo, M, Wong, PC, Zhu, L, Susac, D, Campbell, SA, Mitchell, KAR, Parsons, RR, Bizzotto, D
JournalApplied Surface Science
Volume253
Pagination1130–1134
Date Publishednov