| Title | Characterization of a Co–Se thin film by scanning Auger microscopy and Raman spectroscopy |
| Publication Type | Journal Article |
| Year of Publication | 2006 |
| Authors | Teo, M, Wong, PC, Zhu, L, Susac, D, Campbell, SA, Mitchell, KAR, Parsons, RR, Bizzotto, D |
| Journal | Applied Surface Science |
| Volume | 253 |
| Pagination | 1130–1134 |
| Date Published | nov |
