Abstract: In its simplest form, SECM is a scanning probe technique in which a small scale electrode is scanned across an immersed substrate while recording the current response. This response is dependent on both the surface topography and the electrochemical activity of the substrate. Consequently, using an array of operational modes, a wide variety of substrates and experimental systems can be characterized. The strength of SECM lies in its ability to quantify material flux from a surface with a high spatial and temporal resolution. As a result, it has been used in a variety of applications fields, (Figure 1).