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1996
Xu, Y. N. ; Hiew, P. L. ; Klippenstein, M. A. ; Koga, Y. Study Of A Commercial Sio2 Sol And Gel By Small Angle X-Ray Scattering: Effect Of Sample Thickness And Interpretation By Means Of Smoluchowski Scheme. Clays and Clay Minerals 1996, 44, 197-213.