@article {799,
	title = {Characterization of titanium chromium nitride nanocomposite protective coatings},
	journal = {Applied Surface Science},
	volume = {229},
	number = {1-4},
	year = {2004},
	note = {ISI Document Delivery No.: 824INTimes Cited: 12Cited Reference Count: 30},
	month = {May},
	pages = {387-394},
	type = {Article},
	abstract = {The structural, chemical, optical and mechanical properties of titanium chromium nitride nanocrystalline films deposited by ion beam-assisted deposition were studied by means of X-ray diffraction, X-ray photoelectron spectroscopy, spectroscopic ellipsometry, nanoindentation and wear testing. Coatings were deposited on silicon and stainless steel substrates with growth temperatures of 150 and 400 degreesC. The concentration of titanium and chromium in the film was regulated by controlling their evaporation rates. The nitrogen concentration was controlled by varying the nitrogen ion current. X-ray diffraction and X-ray photoelectron spectroscopy measurements indicated that the films deposited at 150 degreesC formed solid solutions whereas those produced at 400 degreesC formed nanocomposites. The optical constants were measured using spectroscopic ellipsometry. A correlation between the elemental/phase composition and optical constants was established. The mechanical properties of the coatings were evaluated using nanohardness testing and were found to depend on composition. The nanocomposite films were the hardest (hardness of 30 GPa and elastic modulus of 300 GPa). Tribological properties of titanium chromium nitride coated 440 C stainless steel coupons were evaluated using a ball-on-disk tribometer. These tests were conducted under a load of 50 N for 1.5 million cycles at 180 rpm. Coatings deposited at high temperature did not show any signs of wear. (C) 2004 Elsevier B.V. All rights reserved.},
	keywords = {B-N, DEPOSITION, ellipsometry, HARD COATINGS, NANOSTRUCTURES, nitrides, SPECTROSCOPY, sputtering, THIN-FILMS, WEAR-RESISTANT COATINGS, X-ray photoelectron},
	isbn = {0169-4332},
	url = {<Go to ISI>://000221680100050},
	author = {Aouadi, S. M. and Wong, K. C. and Mitchell, K. A. R. and Namavar, F. and Tobin, E. and Mihut, D. M. and Rohde, S. L.}
}
@article {798,
	title = {Titanium boron nitride films grown by ion beam assisted deposition: chemical and optical characterization},
	journal = {Surface \& Coatings Technology},
	volume = {183},
	number = {2-3},
	year = {2004},
	note = {ISI Document Delivery No.: 822CMTimes Cited: 4Cited Reference Count: 41},
	month = {May},
	pages = {369-377},
	type = {Article},
	abstract = {Titanium boron nitride films with a functionally graded underlayer of Ti/TiN were grown at low temperatures ( < 200 degreesC) on a silicon substrate using ion beam assisted deposition. These coatings had a total thickness of 1.5 +/- 0.2 mum. They were characterized using X-ray diffraction (XRD), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) and spectroscopic ellipsometry. The primary phases in the film were identified using XRD and were found to be in agreement with the equilibrium phase diagram. The surface morphology and nanocrystalline nature of the coating were deduced using AFM. The chemical and phase composition was determined from XPS measurements. The refractive indices were deduced from the investigation of the ellipsometric data and were subsequently correlated to the elemental and phase composition. The hardness and elastic modulus were measured and were found to depend on phase composition. The films were implanted with carbon ions. XPS measurements revealed that new phases formed at the surface as a result of carbon implantation, namely, titanium carbide and elemental carbon. Carbon implantation significantly reduced the friction coefficient from 0.5-0.7 to 0.15-0.25. The hardness of the films decreased by 2-5\%. (C) 2003 Elsevier B.V. All rights reserved.},
	keywords = {B-N COATINGS, ellipsometry, HARD COATINGS, ion beam assisted deposition, MECHANICAL-PROPERTIES, nanocrystal, NITRIDE, SUPERHARD NANOCOMPOSITE COATINGS, THIN-FILMS, TIBXNY COATINGS, X-ray photoelectron spectroscopy},
	isbn = {0257-8972},
	url = {<Go to ISI>://000221512300031},
	author = {Aouadi, S. M. and Debessai, M. and Namavar, E. and Wong, K. C. and Mitchell, K. A. R.}
}
