@article {1282,
	title = {Pre-treatments applied to oxidized aluminum surfaces to modify the interfacial bonding with bis-1,2-(triethoxysilyl)ethane (BTSE) - Part I. High-purity Al with native oxide},
	journal = {Applied Surface Science},
	volume = {252},
	number = {5},
	year = {2005},
	note = {ISI Document Delivery No.: 993WHTimes Cited: 5Cited Reference Count: 39},
	month = {Dec},
	pages = {1293-1304},
	type = {Article},
	abstract = {A remote microwave-generated H-2 plasma and heating to 250 degrees C were separately used to modify high-purity oxidized aluminum surfaces and to assess whether these treatments can help enhance adhesion with bis-1,2-(triethoxysilyl)ethane (BTSE) coatings. Different initial oxide surfaces were considered, corresponding to the native oxide and to surfaces formed by the Forest Products Laboratory (FPL) treatment applied for either 15 or 60 min. BTSE is applied from solution at pH 4, and competing processes of etching, protonation (to form OH groups) and coupling (to form Al-O-Si interfacial bonds) occur at the solid-liquid interface. Scanning electron microscopy (SEM) was used to determine how the topographies of the modified Al surfaces changed with the different pre-treatments and with exposure to a buffer solution of pH 4. Secondary-ion mass spectrometry (SIMS) was used to determine the direct amount of Al-O-Si interfacial bonds by measuring the ratio of peak intensities 71-70 amu, while X-ray photoelectron spectroscopy (XPS) was used to determine the overall strength of the silane coating adhesion by measuring the Si 2p signals before and after application of an ultrasonic rinse to the coated sample. Measured Al 2p and O 1s spectra helped assess how the different pre-treatments modified the various Al oxidized surfaces prior to BTSE coating. Pre-treated samples that showed increased Al-O-Si bonding after BTSE coating corresponded to surfaces, which did not show evidence of significant etching after exposure to a pH 4 environment. This suggests that such surfaces are more receptive to the coupling reaction during exposure to the BTSE coating solution. These surfaces include all H-2 plasma-treated samples, the heated native oxide and the sample that only received the 15 min FPL treatment. In contrast, other surfaces that show evidence of etching in pH 4 environments are samples that received lower amounts of Al-O-Si interfacial bonding. Overall, heating improved the BTSE adhesive bonding for the native Al oxide, while H-2 plasma treatment improved the BTSE bonding for surfaces that had initially been FPL-treated for 15 and 60 min. (c) 2005 Elsevier B.V All rights reserved.},
	keywords = {aluminum, ESCA, OXIDATION, PARALLEL FACTOR-ANALYSIS, silane adsorption, SILANE COUPLING AGENTS, SIMS, SPECTROSCOPY, surface pre-treatment, THIN-FILMS, TOF-SIMS, X-ray photoelectron, XPS, XPS INVESTIGATIONS, ZIRCONIUM-OXIDE},
	isbn = {0169-4332},
	url = {<Go to ISI>://000233985900014},
	author = {Teo, M. and Kim, J. and Wong, P. C. and Wong, K. C. and Mitchell, K. A. R.}
}
@article {1153,
	title = {Pre-treatments applied to oxidized aluminum surfaces to modify the interfacial bonding with bis-1,2-(triethoxysilyl)ethane (BTSE) - Part II. Anodized 7075-T6 Al alloy},
	journal = {Applied Surface Science},
	volume = {252},
	number = {5},
	year = {2005},
	note = {ISI Document Delivery No.: 993WHTimes Cited: 6Cited Reference Count: 46},
	month = {Dec},
	pages = {1305-1312},
	type = {Article},
	abstract = {The methods of X-ray pbotoelectron spectroscopy (XPS), secondary-ion mass spectrometry (SIMS), and scanning electron microscopy (SEM) have been used to investigate aspects of the bonding of bis-1,2-(triethoxysilyl)ethane (BTSE) onto anodized samples of 7075-T6 aluminum alloy that have been subjected to the various pre-treatments considered in Part I. The oxide layer thins when this sample is subjected to a Forest Products Laboratory (FPL) treatment; topographical changes are detected by SEM after only 5 min, and the "scallop structures" increase in size for longer times of the FPL treatment. These 7075-Al surfaces adsorb more BTSE than the high-purity Al samples considered in Part I, although the interfacial bonding indicated by the [AlOSi](+)/[Al2O](+) SIMS ratios measured for the former samples are constant for different times of FPL treatment, unlike the situation for high-purity Al. Heating anodized 7075-Al samples, either before or after FPL treatment, has no significant effect on the subsequent BTSE adsorption, but a H-2 plasma treatment can enhance the interfacial Al-O-Si bonding with a decrease in the total BTSE polymerization. (c) 2005 Elsevier B.V. All rights reserved.},
	keywords = {2024-T3, AGENTS, aluminum, corrosion, COUPLING, ESCA, HYDROXIDES, silane adsorption, SIMS, SPECTROSCOPY, surface pre-treatment, THIN-FILMS, X-ray photoelectron, XPS, XPS INVESTIGATIONS, ZIRCONIUM-OXIDE},
	isbn = {0169-4332},
	url = {<Go to ISI>://000233985900015},
	author = {Kim, J. and Teo, M. and Wong, P. C. and Wong, K. C. and Mitchell, K. A. R.}
}
@article {799,
	title = {Characterization of titanium chromium nitride nanocomposite protective coatings},
	journal = {Applied Surface Science},
	volume = {229},
	number = {1-4},
	year = {2004},
	note = {ISI Document Delivery No.: 824INTimes Cited: 12Cited Reference Count: 30},
	month = {May},
	pages = {387-394},
	type = {Article},
	abstract = {The structural, chemical, optical and mechanical properties of titanium chromium nitride nanocrystalline films deposited by ion beam-assisted deposition were studied by means of X-ray diffraction, X-ray photoelectron spectroscopy, spectroscopic ellipsometry, nanoindentation and wear testing. Coatings were deposited on silicon and stainless steel substrates with growth temperatures of 150 and 400 degreesC. The concentration of titanium and chromium in the film was regulated by controlling their evaporation rates. The nitrogen concentration was controlled by varying the nitrogen ion current. X-ray diffraction and X-ray photoelectron spectroscopy measurements indicated that the films deposited at 150 degreesC formed solid solutions whereas those produced at 400 degreesC formed nanocomposites. The optical constants were measured using spectroscopic ellipsometry. A correlation between the elemental/phase composition and optical constants was established. The mechanical properties of the coatings were evaluated using nanohardness testing and were found to depend on composition. The nanocomposite films were the hardest (hardness of 30 GPa and elastic modulus of 300 GPa). Tribological properties of titanium chromium nitride coated 440 C stainless steel coupons were evaluated using a ball-on-disk tribometer. These tests were conducted under a load of 50 N for 1.5 million cycles at 180 rpm. Coatings deposited at high temperature did not show any signs of wear. (C) 2004 Elsevier B.V. All rights reserved.},
	keywords = {B-N, DEPOSITION, ellipsometry, HARD COATINGS, NANOSTRUCTURES, nitrides, SPECTROSCOPY, sputtering, THIN-FILMS, WEAR-RESISTANT COATINGS, X-ray photoelectron},
	isbn = {0169-4332},
	url = {<Go to ISI>://000221680100050},
	author = {Aouadi, S. M. and Wong, K. C. and Mitchell, K. A. R. and Namavar, F. and Tobin, E. and Mihut, D. M. and Rohde, S. L.}
}
@article {798,
	title = {Titanium boron nitride films grown by ion beam assisted deposition: chemical and optical characterization},
	journal = {Surface \& Coatings Technology},
	volume = {183},
	number = {2-3},
	year = {2004},
	note = {ISI Document Delivery No.: 822CMTimes Cited: 4Cited Reference Count: 41},
	month = {May},
	pages = {369-377},
	type = {Article},
	abstract = {Titanium boron nitride films with a functionally graded underlayer of Ti/TiN were grown at low temperatures ( < 200 degreesC) on a silicon substrate using ion beam assisted deposition. These coatings had a total thickness of 1.5 +/- 0.2 mum. They were characterized using X-ray diffraction (XRD), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) and spectroscopic ellipsometry. The primary phases in the film were identified using XRD and were found to be in agreement with the equilibrium phase diagram. The surface morphology and nanocrystalline nature of the coating were deduced using AFM. The chemical and phase composition was determined from XPS measurements. The refractive indices were deduced from the investigation of the ellipsometric data and were subsequently correlated to the elemental and phase composition. The hardness and elastic modulus were measured and were found to depend on phase composition. The films were implanted with carbon ions. XPS measurements revealed that new phases formed at the surface as a result of carbon implantation, namely, titanium carbide and elemental carbon. Carbon implantation significantly reduced the friction coefficient from 0.5-0.7 to 0.15-0.25. The hardness of the films decreased by 2-5\%. (C) 2003 Elsevier B.V. All rights reserved.},
	keywords = {B-N COATINGS, ellipsometry, HARD COATINGS, ion beam assisted deposition, MECHANICAL-PROPERTIES, nanocrystal, NITRIDE, SUPERHARD NANOCOMPOSITE COATINGS, THIN-FILMS, TIBXNY COATINGS, X-ray photoelectron spectroscopy},
	isbn = {0257-8972},
	url = {<Go to ISI>://000221512300031},
	author = {Aouadi, S. M. and Debessai, M. and Namavar, E. and Wong, K. C. and Mitchell, K. A. R.}
}
@article {560,
	title = {Insertion and removal of protons in single-crystal orthorhombic molybdenum trioxide under H2S/H-2 and O-2/N-2},
	journal = {Chemistry of Materials},
	volume = {14},
	number = {4},
	year = {2002},
	note = {ISI Document Delivery No.: 542DRTimes Cited: 13Cited Reference Count: 49},
	month = {Apr},
	pages = {1788-1796},
	type = {Article},
	abstract = {Using AFM/XRD/XPS methods, in this paper, we investigate protonation and deprotonation processes in single-crystal samples of orthorhombic molybdenum trioxide (alpha-MoO3). At low temperatures, a small part of alpha-MoO3 is changed to needlelike HxMoO3 (x approximate to 0.33) along <203> directions in a H2S/H-2 gas stream. When these elongated crystallites assemble into a maze structure, the growth of HxMoO3 is gradually ceased due to closing entrance for hydrogen. At higher temperatures, the needlelike HxMoO3 crystallites turn to a growth perpendicular to <203>, which leads to the formation of HxMoO3 blocks. It is observed that the basal plane of alpha-MoO3 is severely buckled upon the protonation. Surface sulfidation is also observed. The formed HxMoO3 or surface MOS2, however, can be readily converted back to their original-phase alpha-MoO3 in air at 350-400 degreesC. This oxidation process gives rise to a flattened (010) topography (i.e., debuckling) on which shallowly divided alpha-MoO3 surface blocks bounded with {101} planes are formed. When an alpha-MoO3 (010) plane embedded with nanocrystallites is used to create surface stress or nucleation sites, the insertion mode of hydrogen along <001> is further reconfirmed in this work. A correlation of surface/bulk phases upon various chemical reactions is addressed, and a model to summarize these changes is also proposed.},
	keywords = {BRONZES, DECOMPOSITION, GROWTH, HXMOO3, HYDROGEN, MOO3, NUCLEAR-MAGNETIC-RESONANCE, RAY PHOTOELECTRON-SPECTROSCOPY, SILICA SUPPORTS, THIN-FILMS, XPS},
	isbn = {0897-4756},
	url = {<Go to ISI>://000175028700050},
	author = {Zeng, H. C. and Xie, F. and Wong, K. C. and Mitchell, K. A. R.}
}
@article {5111,
	title = {Characterization of aluminum surfaces after different pretreatments and exposure to silane coupling agents},
	journal = {Surface Review and Letters},
	volume = {8},
	number = {1-2},
	year = {2001},
	note = {ISI Document Delivery No.: 424EFTimes Cited: 11Cited Reference Count: 34},
	month = {Feb-Apr},
	pages = {43-50},
	type = {Article},
	abstract = {X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and scanning electron microscopy (SEM) have been used to characterize surfaces of aluminum which have been pretreated by mechanical polishing, acid etching and alkaline etching, as well as given subsequent exposures to air and water. These surfaces can differ markedly with regard to their chemical compositions and topographical structures. Characterizations of these surfaces after exposures to three organosilanes, gamma -GPS, BTSE and gamma -APS, indicate that the amount of silane adsorbed in each case shows a tendency to increase both with the number of OH groups detected at the oxidized aluminum and with the surface roughness. The XPS data are consistent with the adhesion of gamma -APS occurring through H bonding, especially via NH3+ groups.},
	keywords = {ADHESION, DURABILITY, GROWTH, INTERFACES, OXIDATION, OXIDE, photoelectron, THIN-FILMS, XPS},
	isbn = {0218-625X},
	url = {<Go to ISI>://000168218600007},
	author = {Kono, M. and Sun, X. and Li, R. and Wong, K. C. and Mitchell, K. A. R. and Foster, T.}
}
@article {4855,
	title = {X-ray photoelectron spectroscopy studies of the stability of Al/Mg/PET interfaces},
	journal = {Surface Review and Letters},
	volume = {7},
	number = {3},
	year = {2000},
	note = {ISI Document Delivery No.: 356MBTimes Cited: 3Cited Reference Count: 33},
	month = {Jun},
	pages = {227-233},
	type = {Article},
	abstract = {The interfacial chemistry of an Al/Mg/PET sample, prepared by thermally evaporating first Mg and then Al on to a polyethyleneterephthalate (PET) film, was studied by X-ray photoelectron spectroscopy (XPS). The Mg/PET system showed two types of Mg species, namely an O-Mg-C complex, from reaction with the carbonyl group on PET, and metal-like clusters. The deposition of Al results in intermetallic mixing, which is manifested by alloy formation and Mg enrichment at the surface. It appears that some Al atoms penetrate the Mg region to react with carbonyl groups in the PET and form an interfacial complex with O-Al-C bonding. The stability of this sample was studied on exposing it to air and then rinsing it with water. The metal overlayers are strongly modified by these treatments, although the bonding at the PET interface appears relatively unchanged.},
	keywords = {AL-MG ALLOYS, aluminum, conjugated polymers, LIGHT-EMITTING-DIODES, MAGNESIUM, METAL, POLY(P-PHENYLENE VINYLENE), POLYIMIDE INTERFACE, THIN-FILMS, XPS},
	isbn = {0218-625X},
	url = {<Go to ISI>://000089446100005},
	author = {Kono, M. and Wong, P. C. and Li, Y. S. and Mitchell, K. A. R.}
}
@article {4403,
	title = {SIMS studies of the effect of H at interfaces formed by oxidized zirconium},
	journal = {Canadian Journal of Chemistry-Revue Canadienne De Chimie},
	volume = {76},
	number = {12},
	year = {1998},
	note = {ISI Document Delivery No.: 180RKTimes Cited: 2Cited Reference Count: 13},
	month = {Dec},
	pages = {1796-1799},
	type = {Article},
	abstract = {Secondary ion mass spectrometry (SIMS) has been used to guide the search for an oxidation procedure that can produce a thin and relatively sharp oxide layer on macroscopic zirconium. A new preparation based on dip coating in H2O2 solution is indicated to be suitable for this purpose. SIMS further indicates that the oxide interface, for such a prepared sample, shows substantial degradation when it is heated in H-2 gas at 300 degrees C. The presence of H appears to facilitate O migration into the metallic region, an observation that supplements those made previously on oxidized thin-film samples of zirconium prepared by deposition under ultrahigh-vacuum conditions.},
	keywords = {electron, GROWTH, HYDROGEN, interfacial reactivity, OXIDATION, OXIDE, oxidized, OXYGEN, secondary ion mass spectrometry, SURFACES, THIN-FILMS, XPS INVESTIGATIONS, ZIRCONIUM, ZR(0001)},
	isbn = {0008-4042},
	url = {<Go to ISI>://000079398800002},
	author = {Shimizu, K. and Flinn, B. J. and Wong, P. C. and Mitchell, K. A. R.}
}
@article {4329,
	title = {A surface spectroscopic study of calcinated molybdenum-aluminum oxide model catalysts},
	journal = {Applied Surface Science},
	volume = {125},
	number = {3-4},
	year = {1998},
	note = {ISI Document Delivery No.: ZH199Times Cited: 7Cited Reference Count: 24},
	month = {Mar},
	pages = {293-299},
	type = {Article},
	abstract = {Supported molybdena model catalysts, prepared by wet deposition of ammonium molybdate on oxide-coated planar samples of aluminum, were studied especially as a function of calcination temperature (200, 350 and 450 degrees C). Characterizations by X-ray photoelectron spectroscopy (XPS), secondary ion mass spectrometry (SIMS) and secondary electron microscopy (SEM) indicate that the Mo disperses uniformly on the support at 450 degrees C. Observations of the Al(KLL) Auger peak, excited by bremsstrahlung radiation, and the corresponding Auger parameter, were taken to indicate the formation of a new surface bonding arrangement after calcination at this temperature. It is hypothesized that direct Mo-O-Al surface linkages are formed at 450 degrees C, and that this provides the driving force for the enhanced Mo dispersion observed. (C) 1998 Elsevier Science B.V.},
	keywords = {CO-MO-GAMMA-AL2O3, OXIDATION, RAMAN, THIN-FILMS, XPS},
	isbn = {0169-4332},
	url = {<Go to ISI>://000073082800005},
	author = {Leung, Y. L. and Flinn, B. J. and Wong, P. C. and Mitchell, K. A. R. and Smith, K. J.}
}
@article {4161,
	title = {Chemical properties of a Nb/Zr interface studied by XPS},
	journal = {Surface Review and Letters},
	volume = {4},
	number = {1},
	year = {1997},
	note = {ISI Document Delivery No.: XA621Times Cited: 1Cited Reference Count: 15},
	month = {Feb},
	pages = {33-37},
	type = {Article},
	abstract = {A film of niobium (similar to 15 A thick) deposited under ultrahigh vacuum (UHV) conditions on polycrystalline zirconium was studied by x-ray photoelectron spectroscopy (XPS) as it was taken through a series of sequential treatments. The Nb-Zr interface, associated with a Nb 3d(5/2) peak at 203.4 eV, is indicated to passivate the underlying Zr to oxygen and hydrogen plasma treatments, which in the absence of Nb would yield substantial oxidation. On heating to 500 degrees C, the pure metallic Nb 3d(5/2) component at 202.2 eV appears, and this change is accompanied by removal of the passivation effect on the substrate.},
	keywords = {corrosion, electron, HYDROGEN, NUCLEAR-REACTION ANALYSIS, SURFACES, THIN-FILMS, WT-PERCENT NB, ZIRCALOY-2, ZIRCONIUM-OXIDE, ZR},
	isbn = {0218-625X},
	url = {<Go to ISI>://A1997XA62100005},
	author = {Wong, K. C. and Wong, P. C. and Li, Y. S. and Mitchell, K. A. R.}
}
@article {3746,
	title = {XPS investigations of the reactivities of oxidized Zr/Nb interfaces formed by deposition on a gold substrate},
	journal = {Applied Surface Science},
	volume = {103},
	number = {4},
	year = {1996},
	note = {ISI Document Delivery No.: VX979Times Cited: 6Cited Reference Count: 18},
	month = {Dec},
	pages = {389-393},
	type = {Article},
	abstract = {The interaction of a film of Zr (similar to 38 Angstrom thick) deposited under ultrahigh vacuum (UHV) on to an approximately 12 Angstrom film of NbO on a gold substrate has been studied with X-ray photoelectron spectroscopy (XPS). Evidence is presented for an interfacial conversion from Zr and NbO to ZrO2 and Nb. The reactivity of this sample was studied through a series of sequential treatments. Although changes occur in the topmost layer, the Zr/Nb interfacial region, as identified by a shoulder at similar to 180 eV in Zr 3d and the 203.0 eV peak in Nb 3d, appears to be remarkably inert on heating at 300 degrees C under UHV, as well as on subjecting to O-2 and hydrogen plasma treatments.},
	keywords = {corrosion, HYDROGEN, NUCLEAR-REACTION ANALYSIS, THIN-FILMS, WT-PERCENT NB, ZIRCALOY-2, ZIRCONIUM-OXIDE, ZR},
	isbn = {0169-4332},
	url = {<Go to ISI>://A1996VX97900009},
	author = {Li, Y. S. and Wong, K. C. and Wong, P. C. and Mitchell, K. A. R.}
}
@article {3424,
	title = {XPS studies for an iron-zirconium interface in an oxidizing environment},
	journal = {Surface Review and Letters},
	volume = {2},
	number = {6},
	year = {1995},
	note = {ISI Document Delivery No.: TP614Times Cited: 2Cited Reference Count: 11},
	month = {Dec},
	pages = {759-763},
	type = {Article},
	abstract = {A bimetallic film of iron and zirconium (thicknesses about 17 and 52 Angstrom respectively) was deposited on a gold substrate and studied by XPS after exposing to O-2 (approximately 10(3) L) at room temperature, and then heating at progressively higher temperatures up to 400 degrees C. An iron-oxide/iron/zirconium-oxide sandwich structure is present after the room-temperature exposure to O-2, and this work shows the ready transfer of O from the iron side to the zirconium side of the Fe/Zr interface. Fe migration also occurs at 220 degrees C and above, while by 300 degrees C this diffusion appears to cause a substantial restructuring of the ZrO2 layer.},
	keywords = {DIFFUSION, THIN-FILMS, WT-PERCENT NB},
	isbn = {0218-625X},
	url = {<Go to ISI>://A1995TP61400007},
	author = {Li, Y. S. and Liu, W. and Wong, P. C. and Mitchell, K. A. R.}
}
@article {2858,
	title = {X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES WITH A BIAS-POTENTIAL METHOD FOR STUDYING SILANE ALUMINUM INTERFACES},
	journal = {Journal of Materials Science Letters},
	volume = {12},
	number = {11},
	year = {1993},
	note = {ISI Document Delivery No.: LH254Times Cited: 17Cited Reference Count: 14},
	month = {Jun},
	pages = {844-846},
	type = {Article},
	keywords = {SURFACES, THIN-FILMS, XPS},
	isbn = {0261-8028},
	url = {<Go to ISI>://A1993LH25400024},
	author = {Leung, Y. L. and Yang, Y. P. and Wong, P. C. and Mitchell, K. A. R. and Foster, T.}
}
