@inbook {833,
	title = {Measuring the silion fluoride bond distance in zeolites},
	booktitle = {Recent Advances in the Science and Technology of Zeolites and Related Materials, Pts a - C},
	series = {Studies in Surface Science and Catalysis},
	volume = {154},
	year = {2004},
	note = {ISI Document Delivery No.: BBR47Times Cited: 0Cited Reference Count: 19Proceedings Paper14th International Zeolite Conference on Recent Advances in the Science and Technology of Zeolites and Related MaterialsAPR 25-30, 2004Cape Town, SOUTH AFRICASARA BURGERHARTSTRAAT 25, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS},
	pages = {1319-1323},
	publisher = {Elsevier Science Bv},
	organization = {Elsevier Science Bv},
	address = {Amsterdam},
	abstract = {A common misconception is that X-ray diffraction is the best way to measure bond distances. However, in some cases where disorder is present it can yield incorrect answers. The silicon-fluoride bond distance in fluoride-containing zeolite SFF has been measured using two magic angle spinning NMR techniques. Both techniques, variable contact time cross polarization and spinning side hand intensity fitting give shorter Si-F bond distances than X-ray diffraction.},
	keywords = {5-COORDINATE SILICON, COMPLEX, IFR, IONS, LOCATION, MEDIA, MOLECULAR-SIEVES, SOLID-STATE NMR, STF, TEMPLATE},
	isbn = {0167-29910-444-51805-3},
	url = {<Go to ISI>://000227357201022},
	author = {Darton, R. J. and Brouwer, D. H. and Fyfe, C. A. and Villaescusa, L. A. and Morris, R. E.},
	editor = {VanSteen, E. and Claeys, M. and Callanan, L. H.}
}
@article {834,
	title = {Solid-state NMR studies of the fluoride-containing zeolite SSZ-44},
	journal = {Chemistry of Materials},
	volume = {16},
	number = {4},
	year = {2004},
	note = {ISI Document Delivery No.: 774YATimes Cited: 12Cited Reference Count: 21},
	month = {Feb},
	pages = {600-603},
	type = {Article},
	abstract = {Magic-angle spinning NMR has been used to probe the local structure of as-made zeolite SFF containing occluded fluoride and NN-diethyl-2,6-dimethylpiperidinium. The Si-F bond distance has been measured using two methods: variable contact time cross polarization studies (1.74 Angstrom) and spinning sideband intensity fitting at relatively slow spinning speeds (1.79 Angstrom). Both measurements yield results that are significantly shorter than the internuclear Si-F distance as measured by single-crystal X-ray diffraction (similar to1.9 Angstrom), which is based on the average positions of the atoms due to disorder and hence does not reflect the true bond distance.},
	keywords = {5-COORDINATE SILICON, COMPLEX, IFR, IONS, LOCATION, MEDIA, MOLECULAR-SIEVES, SPECTROSCOPY, STF, TEMPLATE},
	isbn = {0897-4756},
	url = {<Go to ISI>://000189012900008},
	author = {Darton, R. J. and Brouwer, D. H. and Fyfe, C. A. and Villaescusa, L. A. and Morris, R. E.}
}
