@inbook {2604,
	title = {Relaxation Behavior for the Lorentz Fokker Planck Equation: Model Cross Sections and Nonextensive Entropy},
	booktitle = {Rarefied Gas Dynamics},
	series = {Aip Conference Proceedings},
	volume = {1084},
	year = {2009},
	note = {ISI Document Delivery No.: BJF97Times Cited: 0Cited Reference Count: 19Shizgal, Bernie D.Proceedings Paper26th International Symposium on Rarefied Gas Dynmaics (RGD26)JUN 20-JUL 25, 2008Kyoto, JAPANJapan Soc Promot Sci, Japan Aerpspace Explorat Agcy, Soc Promot Space Sci, Iwantani Naoji Fdn, Inoue Fdn Sci, Casio Sci Promot Fdn, Kaijma Fdn, IHI Corp, IHI Aerospac Engn Co Ltd, Osaka Vaccuun Ltd, Nissin Inc2 HUNTINGTON QUADRANGLE, STE 1NO1, MELVILLE, NY 11747-4501 USA},
	pages = {39-44},
	publisher = {Amer Inst Physics},
	organization = {Amer Inst Physics},
	address = {Melville},
	abstract = {The relaxation behavior of a test particle in a background gas at equilibrium for which the test particle background particle mass ratio, m(t)/m(b) tends to zero, that is the Lorentz limit, is studied with the Lorentz-Fokker-Planck equation. This is the situation for electrons in inert gases. If there is also an applied electric field the stationary distribution is not the equilibrium Maxwellian. In the present paper, the evolution of the isotropic distribution function is studied with both a finite difference solution and one based on the expansion of the distribution function in the eigenfunctions of the Fokker-Planck operator. The eigenvalue spectrum depends strongly on the velocity dependence of the momentum transfer cross section in the Fokker-Planck equation. In particular, the spectrum is composed of a discrete spectrum and a continuum, and the continuum can dominate the spectrum. The role of the eigenvalue spectrum of this operator on the time evolution of the distribution function is studied. In particular, the time dependence of the entropy is determined and we show that the Kullback-Leibler entropy rationalizes the approach to a stationary distribution. The Tsallis non-extensive entropy is not required to explain the evolution of the distributions.},
	keywords = {Boltzmann equation, DEGRADATION, electron, Maxwell molecules, METHOD QDM, NONCLASSICAL BASIS FUNCTIONS, pseudospectral method, QUADRATURE DISCRETIZATION METHOD, quantum cross section, RARE-GAS MODERATORS, SUPRATHERMAL PARTICLE DISTRIBUTIONS, THERMALIZATION},
	isbn = {0094-243X978-0-7354-0615-5},
	url = {<Go to ISI>://000265564800005},
	author = {Shizgal, B. D.},
	editor = {Abe, T.}
}
@article {4403,
	title = {SIMS studies of the effect of H at interfaces formed by oxidized zirconium},
	journal = {Canadian Journal of Chemistry-Revue Canadienne De Chimie},
	volume = {76},
	number = {12},
	year = {1998},
	note = {ISI Document Delivery No.: 180RKTimes Cited: 2Cited Reference Count: 13},
	month = {Dec},
	pages = {1796-1799},
	type = {Article},
	abstract = {Secondary ion mass spectrometry (SIMS) has been used to guide the search for an oxidation procedure that can produce a thin and relatively sharp oxide layer on macroscopic zirconium. A new preparation based on dip coating in H2O2 solution is indicated to be suitable for this purpose. SIMS further indicates that the oxide interface, for such a prepared sample, shows substantial degradation when it is heated in H-2 gas at 300 degrees C. The presence of H appears to facilitate O migration into the metallic region, an observation that supplements those made previously on oxidized thin-film samples of zirconium prepared by deposition under ultrahigh-vacuum conditions.},
	keywords = {electron, GROWTH, HYDROGEN, interfacial reactivity, OXIDATION, OXIDE, oxidized, OXYGEN, secondary ion mass spectrometry, SURFACES, THIN-FILMS, XPS INVESTIGATIONS, ZIRCONIUM, ZR(0001)},
	isbn = {0008-4042},
	url = {<Go to ISI>://000079398800002},
	author = {Shimizu, K. and Flinn, B. J. and Wong, P. C. and Mitchell, K. A. R.}
}
@article {4161,
	title = {Chemical properties of a Nb/Zr interface studied by XPS},
	journal = {Surface Review and Letters},
	volume = {4},
	number = {1},
	year = {1997},
	note = {ISI Document Delivery No.: XA621Times Cited: 1Cited Reference Count: 15},
	month = {Feb},
	pages = {33-37},
	type = {Article},
	abstract = {A film of niobium (similar to 15 A thick) deposited under ultrahigh vacuum (UHV) conditions on polycrystalline zirconium was studied by x-ray photoelectron spectroscopy (XPS) as it was taken through a series of sequential treatments. The Nb-Zr interface, associated with a Nb 3d(5/2) peak at 203.4 eV, is indicated to passivate the underlying Zr to oxygen and hydrogen plasma treatments, which in the absence of Nb would yield substantial oxidation. On heating to 500 degrees C, the pure metallic Nb 3d(5/2) component at 202.2 eV appears, and this change is accompanied by removal of the passivation effect on the substrate.},
	keywords = {corrosion, electron, HYDROGEN, NUCLEAR-REACTION ANALYSIS, SURFACES, THIN-FILMS, WT-PERCENT NB, ZIRCALOY-2, ZIRCONIUM-OXIDE, ZR},
	isbn = {0218-625X},
	url = {<Go to ISI>://A1997XA62100005},
	author = {Wong, K. C. and Wong, P. C. and Li, Y. S. and Mitchell, K. A. R.}
}
@article {2928,
	title = {XPS STUDIES OF THE STABILITY AND REACTIVITY OF THIN-FILMS OF OXIDIZED ZIRCONIUM},
	journal = {Applied Surface Science},
	volume = {72},
	number = {3},
	year = {1993},
	note = {ISI Document Delivery No.: MF104Times Cited: 21Cited Reference Count: 32},
	month = {Nov},
	pages = {237-244},
	type = {Article},
	abstract = {X-ray photoelectron spectroscopy (XPS) has been used to characterize thin films formed by the deposition of zirconium on to gold foil. With deposition rates of the order of 1 angstrom min-1, in the presence of an atmosphere of 10(-9) mbar H2O, the film has an outer region Of ZrO2 and inner regions of a lower oxidation state material, ZrO(x), and Zr-Au alloy. Initially both ZrO(x) and Zr-Au alloy are oxidized by either H2O or O2 at 300-degrees-C, although this process is hindered as the ZrO2 layer gets thicker. However, even with the protective oxide layer, heating in 5 x 10(-7) mbar D2 (with a partial pressure of 10(-9) mbar H2O) can convert ZrO(x) to ZrO2, a reaction apparently facilitated by migrating D atoms.},
	keywords = {ADSORPTION, AES, BINDING-ENERGY SHIFTS, electron, HYDROGEN, OXIDATION, OXYGEN, RAY PHOTOELECTRON-SPECTROSCOPY, SINGLE-CRYSTAL, SURFACES, ZR},
	isbn = {0169-4332},
	url = {<Go to ISI>://A1993MF10400004},
	author = {Wang, Y. M. and Li, Y. S. and Wong, P. C. and Mitchell, K. A. R.}
}
@article {7325,
	title = {X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF THE INTERACTION OF LOW-ENERGY CARBON-IONS WITH GAAS AND INP},
	journal = {Journal of Vacuum Science \& Technology a-Vacuum Surfaces and Films},
	volume = {10},
	number = {4},
	year = {1992},
	note = {ISI Document Delivery No.: JE681Times Cited: 6Cited Reference Count: 1938TH NATIONAL SYMP OF THE AMERICAN VACUUM SOCNOV 10-15, 1991SEATTLE, WAAMER VACUUM SOCPart 1},
	month = {Jul-Aug},
	pages = {1358-1364},
	type = {Proceedings Paper},
	abstract = {To simulate the low energy ion bombardment that occurs in reactive ion etching (RIE) using alkanes, GaAs and InP were exposed to 20, 100, and 500 eV carbon ions, using a mass-separated carbon ion beam in an ultrahigh vacuum chamber. The InP sample structure consisted of a 40 angstrom ultrathin, epitaxial InP layer on InGaAs. The changes induced by ion bombardment and the effects of subsequent damage-removal treatments were determined by in situ polar-angle dependent x-ray photoelectron spectroscopy. Initially, carbon ion irradiation caused minor sputtering of the semiconductors and preferential removal of the group V constituents, with concurrent formation of carbon-semiconductor phases. The depth of these phases and the extent of the damage increased with increasing bombardment energy. An amorphous carbon residue formed after further bombardment. Several damage removal techniques were applied to the carbon bombarded surfaces. It was found that heating was ineffective in annealing the damage, although surface Fermi level movements were observed. Ozone oxidation did not remove the residual carbon efficiently, yet the underlying semiconductor components were readily oxidized. Hydrogen ion bombardment was effective in removing the carbon bombardment induced damage. The implications of these results for alkane based RIE processes are discussed.},
	keywords = {AES, BOMBARDMENT, COMPOUND SEMICONDUCTORS, DAMAGE, electron},
	isbn = {0734-2101},
	url = {<Go to ISI>://A1992JE68100140},
	author = {Meharg, P. E. A. and Ogryzlo, E. A. and Bello, I. and Lau, W. M.}
}
@article {6889,
	title = {QUANTUM PHENOMENA AND SOLVENT EFFECTS ON ADDITION OF HYDROGEN ISOTOPES TO BENZENE AND TO DIMETHYLBUTADIENE},
	journal = {Berichte Der Bunsen-Gesellschaft-Physical Chemistry Chemical Physics},
	volume = {94},
	number = {11},
	year = {1990},
	note = {ISI Document Delivery No.: EU906Times Cited: 18Cited Reference Count: 4189TH GENERAL ASSEMBLY OF THE DEUTSCHE-BUNSEN-GESELLSCHAFT-FUR-PHYSIKALISCHE-CHEMIE ( ON THE 65TH BIRTHDAY OF THEODOR ACKERMANN ) : CHEMICAL ELEMENTAL REACTIONSMAY 24-26, 1990TUBINGEN, FED REP GERDEUT BUNSEN GESELL PHYS CHEM},
	month = {Nov},
	pages = {1224-1230},
	type = {Proceedings Paper},
	abstract = {Rate constants have been measured for the reaction of the light hydrogen isotope muonium with benzene and 2,3-dimethylbutadiene-1,3 in the gas phase and in several solvents. Comparison with H atom data reveals (1) appreciable kinetic isotope effects, (2) a strong contribution of tunnelling for the activated reaction with benzene, (3) encounter controlled reaction for Mu addition to the diene, (4) a mass dependence of the diffusion constant of hydrogen isotopes in solution, and (5) an enhancement of the rate constant in solution over that in the gas phase by a factor, except for water, of the inverse Ostwald solubility coefficient for hydrogen. The isotope-dependent reduction of the solvent effect in water is tentatively ascribed to the dynamics of the clathrate-like structure when the hydrogen atom reacts.},
	keywords = {ATOM, DIFFUSION, electron, ELEMENTARY REACTIONS, GASES, ISOTOPE EFFECTS, KINETICS, LIQUIDS, muonium, radicals, RATE CONSTANTS, solutions, WATER},
	isbn = {0005-9021},
	url = {<Go to ISI>://A1990EU90600008},
	author = {Roduner, E. and Louwrier, P. W. F. and Brinkman, G. A. and Garner, D. M. and Reid, I. D. and Arseneau, D. J. and Senba, M. and Fleming, Donald G.}
}
