@article {2858,
	title = {X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES WITH A BIAS-POTENTIAL METHOD FOR STUDYING SILANE ALUMINUM INTERFACES},
	journal = {Journal of Materials Science Letters},
	volume = {12},
	number = {11},
	year = {1993},
	note = {ISI Document Delivery No.: LH254Times Cited: 17Cited Reference Count: 14},
	month = {Jun},
	pages = {844-846},
	type = {Article},
	keywords = {SURFACES, THIN-FILMS, XPS},
	isbn = {0261-8028},
	url = {<Go to ISI>://A1993LH25400024},
	author = {Leung, Y. L. and Yang, Y. P. and Wong, P. C. and Mitchell, K. A. R. and Foster, T.}
}
