@article {3563,
	title = {XPS INVESTIGATIONS OF THE INTERACTIONS OF HYDROGEN WITH THIN-FILMS OF ZIRCONIUM-OXIDE .1. HYDROGEN TREATMENTS ON A 10-ANGSTROM THICK-FILM},
	journal = {Applied Surface Science},
	volume = {89},
	number = {3},
	year = {1995},
	note = {ISI Document Delivery No.: RG147Times Cited: 19Cited Reference Count: 19},
	month = {Jul},
	pages = {255-261},
	type = {Article},
	abstract = {Interactions of hydrogen with the interface formed between ZrO2 and zirconium suboxide (ZrOx, x < 2) were studied on a 10 Angstrom zirconium oxide film prepared on gold foil for X-ray photoelectron spectroscopy (XPS) analysis. This film was subject to a set of sequential treatments. Reaction with II, gas at 2 mbar pressure and room temperature indicates that the ZrO2/ZrOx interface appeared to undergo a redox-type reaction and convert to a new ZrO2/ZrOy (x < y < 2) film. Heating this structure at 300 degrees C in a 10(-9) mbar vacuum (residual gas dominantly H2O) resulted in more ZrO2 in the outer region and less ZrO, in the subsurface. By contrast, when this film was treated with a hydrogen plasma, XPS showed enhanced formation of -OH groups and complete conversion to the ZrO2-like form. On heating to 300 degrees C, this uniform film regenerates the ZrO2/ZrOy interface structure, apparently with desorption of H2O.},
	keywords = {OXYGEN, RAY PHOTOELECTRON-SPECTROSCOPY, SIMS, SURFACE OXIDATION, ZRO2},
	isbn = {0169-4332},
	url = {<Go to ISI>://A1995RG14700005},
	author = {Wong, P. C. and Li, Y. S. and Zhou, M. Y. and Mitchell, K. A. R.}
}
