@article { ISI:000086254800002,
	title = {Electron momentum spectroscopy of surfaces},
	journal = {SURFACE REVIEW AND LETTERS},
	volume = {6},
	number = {5},
	year = {1999},
	note = {6th International Conference on the Structure of Surfaces (ICSOS-6), UNIV BRITISH COLUMBIA, VANCOUVER, CANADA, JUL 26-30, 1999},
	month = {OCT},
	pages = {579-584},
	publisher = {Univ British Columbia; Amer Vacuum Soc, Pacific NW Chapter; US DOE; Canadian Soc Chem, Div Surfaces Sci; Canadian Assoc Phys, Div Surfaces Sci; ELMITEC; Elsevier Sci; Int Union Pure \& Appl Phys; Leybold; NRC; Natl Vacuum Technol; OCI; Vacuum Microengn; OM},
	abstract = {Electron momentum spectroscopy {[}binary (e,2e) spectroscopy] using transmission geometry is a unique experimental tool for imaging the electron momentum distribution in gas phase samples as well as in thin films. In a solid, the electron momentum distribution is related to the band structure. Development of the (e,2e) technique using a more versatile reflection geometry is attractive since a much wider range of surfaces could be studied. The design of a new reflection (e,2e) spectrometer is presented. It is based on a two-step scattering model in which an incident electron successively reflects and ejects a valence electron from the surface. The scattered and ejected electrons are detected in coincidence and their energies and momentum vectors are simultaneously determined using a high throughput 90 degrees truncated spherical electrostatic analyzer and position-sensitive detectors.},
	issn = {0218-625X},
	doi = {10.1142/S0218625X99000524},
	author = {Tixier, S and Zheng, Y and Tiedje, T and Cooper, G and Brion, CE}
}
