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XPS investigations of the reactivities of oxidized Zr/Nb interfaces formed by deposition on a gold substrate

TitleXPS investigations of the reactivities of oxidized Zr/Nb interfaces formed by deposition on a gold substrate
Publication TypeJournal Article
Year of Publication1996
AuthorsLi, YS, Wong, KC, Wong, PC, Mitchell, KAR
JournalApplied Surface Science
Volume103
Pagination389-393
Date PublishedDec
Type of ArticleArticle
ISBN Number0169-4332
Keywordscorrosion, HYDROGEN, NUCLEAR-REACTION ANALYSIS, THIN-FILMS, WT-PERCENT NB, ZIRCALOY-2, ZIRCONIUM-OXIDE, ZR
Abstract

The interaction of a film of Zr (similar to 38 Angstrom thick) deposited under ultrahigh vacuum (UHV) on to an approximately 12 Angstrom film of NbO on a gold substrate has been studied with X-ray photoelectron spectroscopy (XPS). Evidence is presented for an interfacial conversion from Zr and NbO to ZrO2 and Nb. The reactivity of this sample was studied through a series of sequential treatments. Although changes occur in the topmost layer, the Zr/Nb interfacial region, as identified by a shoulder at similar to 180 eV in Zr 3d and the 203.0 eV peak in Nb 3d, appears to be remarkably inert on heating at 300 degrees C under UHV, as well as on subjecting to O-2 and hydrogen plasma treatments.

URL<Go to ISI>://A1996VX97900009