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Characterization of a Co-Se thin film by scanning Auger microscopy and Raman spectroscopy

TitleCharacterization of a Co-Se thin film by scanning Auger microscopy and Raman spectroscopy
Publication TypeJournal Article
Year of Publication2006
AuthorsTeo, M, Wong, PC, Zhu, L, Susac, D, Campbell, SA, Mitchell, KAR, Parsons, RR, Bizzotto, D
JournalApplied Surface Science
Volume253
Pagination1130-1134
Date PublishedNov
ISBN Number0169-4332
Abstract

Scanning Auger microscopy and micro-Raman spectroscopy are combined to characterize a Co-Se thin film sample, containing 84 at.% Se, which had been modified in localized areas following excitation with an intense focused Ar+ laser (514.5 nm). The information obtained helps to establish that a previous assignment for a Co-Se sample of Raman features between 168 and 175 cm(-1) actually refers to an oxygenated Co-Se species, and that Co-Se interactions in a Se-rich environment give rise to Raman structure between 181 and 184 cm(-1). Comparisons are made for the use of Ar+ and HeNe laser sources for Raman measurements in this context; the latter in general gives both better resolution and better signal-to-noise characteristics. (c) 2006 Elsevier B.V. All rights reserved.

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